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  <titleInfo>
    <title>Electrical Overstress (EOS)</title>
  </titleInfo>
  <name type="personal">
    <namePart>Voldman, Steven H.</namePart>
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    <place>
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    <publisher>John Wiley &amp; Sons</publisher>
    <dateIssued>c 2014</dateIssued>
    <dateIssued encoding="marc" point="start">2014</dateIssued>
    <dateIssued encoding="marc" point="end">2013</dateIssued>
    <issuance>monographic</issuance>
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  <physicalDescription>
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    <extent>xxiii, 344 p. : ill. ;</extent>
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  <note type="statement of responsibility">Steven H. Voldman.</note>
  <note>Includes bibliographical references and index.</note>
  <subject>
    <topic>Semiconductors</topic>
    <topic>Failures</topic>
  </subject>
  <subject>
    <topic>Semiconductors</topic>
    <topic>Protection</topic>
  </subject>
  <classification authority="ddc" edition="23">621.3815</classification>
  <identifier type="isbn">9781118511886</identifier>
  <identifier type="isbn">9781118703328</identifier>
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