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  <titleInfo>
    <title>Fringe pattern analysis for optical metrology</title>
    <subTitle>theory, algorithms, and applications</subTitle>
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  <name type="personal">
    <namePart>Servin, Manuel</namePart>
    <role>
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  <name type="personal">
    <namePart>Quiroga, J. Antonio</namePart>
    <role>
      <roleTerm type="text">Joint author</roleTerm>
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  <name type="personal">
    <namePart>Padilla, J. Moises</namePart>
    <role>
      <roleTerm type="text">Joint author</roleTerm>
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    <place>
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    <publisher>Wiley-VCH Verlag GmbH &amp; Co.</publisher>
    <dateIssued>c 2014</dateIssued>
    <dateIssued encoding="marc">2014</dateIssued>
    <issuance>monographic</issuance>
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    <extent>xvi, 327 p. : ill. ;</extent>
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  <note type="statement of responsibility">Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.</note>
  <note>Includes bibliographical references and index.</note>
  <subject authority="lcsh">
    <topic>Interferometry</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Optical measurements</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Diffraction patterns</topic>
  </subject>
  <classification authority="ddc" edition="23">535.4</classification>
  <identifier type="isbn">9783527411528</identifier>
  <identifier type="isbn">9783527681075</identifier>
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