01053nac a2200277 a 4500001001900000003001000019005001700029008004100046020001800087020001800105040004700123082001400170100001900184245015100203260006200354300002600416504005100442650001900493650002500512650002500537700003800562700003700600856011000637942001300747999001500760990197280790107026BD-DhGUBL20260126110750.0251105s2014    ge a     b    001 0 ger d  a9783527411528  a9783527681075  aBD-DhGUBLeBD-DhGUBLcBD-DhGUBLdBD-DhGUBL  223a535.41 aServin, Manuel10aFringe pattern analysis for optical metrology :btheory, algorithms, and applications /cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.  aWeinheim, Germany :bWiley-VCH Verlag GmbH & Co.cc 2014.  axvi, 327 p. :bill. ;  aIncludes bibliographical references and index. 0aInterferometry 0aOptical measurements 0aDiffraction patterns1 aQuiroga, J. AntonioeJoint author1 aPadilla, J. MoiseseJoint author  uhttps://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/9783527681075?download=trueyClick here to download  2ddccEBK  c5365d5365