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008 251105s2014 ge a b 001 0 ger d
020 _a9783527411528
020 _a9783527681075
040 _aBD-DhGUBL
_eBD-DhGUBL
_cBD-DhGUBL
_dBD-DhGUBL
082 _223
_a535.4
100 1 _aServin, Manuel
245 1 0 _aFringe pattern analysis for optical metrology :
_btheory, algorithms, and applications /
_cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
260 _aWeinheim, Germany :
_bWiley-VCH Verlag GmbH & Co.
_cc 2014.
300 _axvi, 327 p. :
_bill. ;
504 _aIncludes bibliographical references and index.
650 0 _aInterferometry
650 0 _aOptical measurements
650 0 _aDiffraction patterns
700 1 _aQuiroga, J. Antonio
_eJoint author
700 1 _aPadilla, J. Moises
_eJoint author
856 _uhttps://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/9783527681075?download=true
_yClick here to download
942 _2ddc
_cEBK
999 _c5365
_d5365