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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
Servin, Manuel
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. - Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. c 2014. - xvi, 327 p. : ill. ;
Includes bibliographical references and index.
9783527411528 9783527681075
Interferometry
Optical measurements
Diffraction patterns
535.4
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. - Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. c 2014. - xvi, 327 p. : ill. ;
Includes bibliographical references and index.
9783527411528 9783527681075
Interferometry
Optical measurements
Diffraction patterns
535.4