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Results of search for 'ccl=Provider:WILEY-VCH Verlag GmbH & Co.'
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Authors
Donnerhacke, Karl-He...
Hommelhoff, Peter
Kaschke, Michael F.
Kling, Matthias
Padilla, J. Moises
Quiroga, J. Antonio
Rill, Michael Stefan
Servin, Manuel
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Diffraction patterns
Interferometry
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1.
Image from Amazon.com
Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
by
Servin, Manuel
Quiroga, J. Antonio
[Joint author]
Padilla, J. Moises
[Joint author]
Material type:
Text
; Format:
print
; Literary form:
Not fiction
Publication details:
Weinheim, Germany :
Wiley-VCH Verlag GmbH & Co.
c 2014
Online resources:
Click here to download
Availability:
No items available.
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2.
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Optical devices in ophthalmology and optometry : technology, design principles, and clinical applications /
Michael Kaschke, Karl-Heinz Donnerhacke, and Michael Stefan Rill.
by
Kaschke, Michael F
Donnerhacke, Karl-Heinz
[Joint author]
Rill, Michael Stefan
[Joint author]
Material type:
Text
; Format:
print
; Literary form:
Not fiction
Publication details:
Weinheim, Germany :
WILEY-VCH Verlag GmbH & Co.
c 2014
Online resources:
Click here to download
Availability:
No items available.
star rating
Average : 0.0 out of 5 stars
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3.
Image from Amazon.com
Attosecond nanophysics : from basic science to applications /
edited by Peter Hommelhoff, Matthias F. Kling.
by
Hommelhoff, Peter
[editor.]
Kling, Matthias
[editor.]
Material type:
Text
; Format:
print
; Literary form:
Not fiction
Publication details:
Weinheim, Germany
Wiley-VCH Verlag GmbH & Co.
c 2015
Online resources:
Click here to download
Availability:
No items available.
star rating
Average : 0.0 out of 5 stars
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Last Updated July 26, 2026.
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