Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

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TextPublication details: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. c 2014.Description: xvi, 327 p. : illISBN:

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Includes bibliographical references and index.

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